- Saint Philip Street Press
RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
Key Metrics
- Daniel M�ller
- Saint Philip Street Press
- Paperback
- 9781013278624
- 11.02 X 8.5 X 0.43 inches
- 1.07 pounds
- Technology & Engineering > Electronics - General
- English
Book Description
This work was published by Saint Philip Street Press pursuant to a Creative Commons license permitting commercial use. All rights not granted by the work's license are retained by the author or authors.
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