Wiley
Applied GIS and Spatial Analysis
Key Metrics
- John Stillwell
- Wiley
- Hardcover
- 9780470844090
- 9.92 X 6.8 X 1.15 inches
- 2.12 pounds
- Technology & Engineering > General
- English
Secure TransactionBook Description
Only applications-driven book dealing with commerically-sponsored spatial analysis research.
- Focuses on business and public sector planning case studies, offering readers a snapshot of the use of spatial analysis across a broad range of areas.
- Internationally-renowned editors and contributors present a broad variety of global applications, and demonstrate GIS components and spatial methodologies in practice.
Author Bio
John Stillwell was born in Melbourne, Australia, and taught at Monash University from 1970 until 2001, before moving to USF in 2002.
He was an invited speaker at the International Congress of Mathematicians in 1994, and his mathematical writing has been honored with the Chauvenet Prize of the Mathematical Association of America in 2005 and the book award of the Association of Jesuit Colleges and Universities in 2009.
Among his best-known books are Mathematics and Its History (3rd edition, 2010) and Yearning for the Impossible (winner of the AJCU book award in 2009).
His interests are history of mathematics in the 19th and 20th centuries, number theory, geometry, algebra, topology, foundations of mathematics.
In Australia during spring and summer.
Source: University of San Francisco
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