Springer
VLSI Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
0
Rate this book
Key Metrics
- Anirban Sengupta
- Springer
- Paperback
- 9789813297661
- 9.21 X 6.14 X 1.57 inches
- 2.4 pounds
- Computers > Hardware - General
- English
$0
List Price:
$0
Save:
$0 ($%)
Format:
Paperback
Shipping
$4
Ships from:
-
Estimated Arrival:
Apr 23 -Apr 25
Available Copies:
10+ Copies
Ready To Buy:
Add to Cart
Secure TransactionSold By:
Readara.com
Add to My Wishlist
Book Description
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
VLSI Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Videos
No Videos
Community reviews
Write a ReviewNo Community reviews